STUDY OF SOME SURFACE DEFECTS FOR SINGLE CRYSTAL SILICON WAFER
STUDY OF SOME SURFACE DEFECTS FOR SINGLE CRYSTAL SILICON WAFER

SARYA D. MOHAMED; HATEM A. TAHA; ARREJ R.SAEED

Volume 7, Issue 1 , April 2013, , Page 218-224

https://doi.org/10.37652/juaps.2013.83053

Abstract
  The single crystal of semiconductor no longer be perfect, but contains some defect in the structure and surface of twining, lineage structure, grain boundaries. Search included the ...  Read More ...