BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONS
BARRIER HEIGHT AND CHANGING INSULATOR THICKNESS OF THIN FILM MIS JUNCTIONS

JassimMohammed Salih

Volume 10, Issue 3 , December 2016, , Page 35-40

https://doi.org/10.37652/juaps.2016.135153

Abstract
  Using thermal evaporation, metal-semiconductor and metal-insulator-semiconductor thin-films were prepared. By using experimental I-V and activation energy measurements, it was determined ...  Read More ...