Document Type : Research Paper

Author

University of Anbar – College of Dentistry

10.37652/juaps.2010.15389

Abstract

Abstract: Thin films of ( ) were deposited on glass substrates at (210) by Chemical Spray Pyrolysis (CSP) technique. The absorption coefficient (ل) was determined from the absorption and transmission using (uv-vis spectrophotometer) jenway (6405uv- vis) at a normal incident of light in the wave length of range (300-700)nm. Using the relationship against һُ, we find that the films have energy gap between (2.3ev-3ev) at (200) and ( ) means the direct type of transmission, also we calculate (Refractive index , Extinction coefficient , real Dielectric constant, Imaging Dielectric constant).

Keywords

Main Subjects

  1. R.M. Holomb ,V.M.Mista, J, Optoelctronic Adv.Mater.6,1177,(2004).
  2. R.M.Holomb , Mista ,P.Jonsson. P.johansoon, N.mateleshhko. Chalcogenide Letters Vol.2,No.7,P.63-69.July 2005.
  3. X.Wuetal., National Renewable Energy Loboratory [Nrel]/Cp-520-31420,May 2002.
  4. I.Caraman, S.Vatava, G.Rusa, Gasin , Chalcogenide Letters Vol.3.No.1, P. 1-7, January 2006.
  5. K.Ramanathan, ,F,S.Hasoon, S.Smith Presented At 13th '' Ictmc'' Oct .14-18,2002.
  6. M.Becerril, H.Silva, O. Zelaya ''Investigation '' Rvista Mexicana De Fisica,50(6) 588-593,Diciembrel 2004.
  7. Kedarsing ,Etl ''Chalcogenide Letters'' Vol.3 No.3 P.33-36.,March 2006.
  8. Class Person. Brazilin Journal Of Physics Vol.36,No.3b.September , 2006.
  9. E,Rittler ,  ''Physics Of Thin Film ''  Vol,8, No.1 (1975).
  10. R.A.Smith. Semiconductor . 2 Cambridge Edition University Press (1987).
  11. S.M.Sze Semiconductor Divice Physics And Technology Translated By F.G.,Hayaty And Ahmmed University Of Mosul 1990.