Document Type : Research Paper

Authors

• MAAD M.AMEEN ¹
• KHALAF I.KHALEE ²
• SABRI J. .MOHAMMED ²

¹ Kirkuk University / College of Science

² Tikrit University/College of Education

Abstract

In this research we study the effect of dopping by Cobalt at the structure properties of pure ZnS thin films. which is prepared by CSP technique on glass substrate at temperature 350C°.XRD technique shows that these films are polycrystalling hexagonal(wurtizt) structure.The dopping Process don't show any obvious differences on the crystalline structure of (ZnS) films but it reduced the value of FWHM. Therefore the grain size are increased. We study the surface nano-structure by(AFM)such that Root Mean Square(RMS) and Roughness average and grain size In 2D,3D with scan sizes 10x10μm2. AFM which shows the film is made of aggregates(clusters).The average grain size of pure thin film equals(176 nm) and dopped thin film with ratio 3% equals (217nm)and for the ratio 5% equals(226nm) .The RMS and rughness average and grain size are increased by dopping. That mean the regularity of AFM results with XRD results according to the increase of grain size after dopping

Keywords

• ZnS

Main Subjects

• Chemistry