W. BEDEAWY; M. H.SUHAIL; H. S.AL-JUMAILI
Abstract
A quaternary structure of Zn:Cd:S:Cu thin films were prepared by chemical spray pyrolysis method with different concentration of Zn and Cu in the solution . The structure and the component ...
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A quaternary structure of Zn:Cd:S:Cu thin films were prepared by chemical spray pyrolysis method with different concentration of Zn and Cu in the solution . The structure and the component were examined by X-ray diffraction , which obtained that all the prepared thin films are polycrystalline and have many phases . The optical characteristics were measured by using a Uv-Vis. Spectrophotometer from the absorption and reflectance spectra within the range (200-1000 nm), such as the energy gap (Eg) , extinction coefficient (k) and the refractive index (n) . We found energy gap changed with concentration and the components of the solution . The value of the energy gap ranged between (1.6-2.5 eV) and the high value of the extinction coefficient given when the quantity of Zn equal to 20ml in the solution and this value equal to 0.55 at wavelength equal 550nm . Also the value of refractive index takes a wide range, it's value decreased when the quantity of Zn was increased . From the D.C. conductivity measurements at the range (295-475K) obtained that the films have two activation energies varied with the variation of the temperature and the concentration of the elements in the compound . From the Hall effect measurements all films which doped by Cu were p-type .
